NISP Home NISP | Nanoscale Imaging, Spectroscopy, and Properties Lab


 

University of Maryland

Nanocenter Logo 
 Materials Research Science & Engineering Centers

National Science Foundation

 

 

About the NISPLab

The Nanoscale Imaging, Spectroscopy, and Properties (NISP) Laboratory was founded in 2005 with the construction of the Kim Engineering Building and the creation of the Maryland NanoCenter. It evolved from the Microscopy and Microanalysis Center (MMC) in the Department of Materials Science and Engineering at the University of Maryland. The MMC provides training of new users on analytical and structural characterization techniques using transmission and/or scanning electron microscopy.

The NISP lab has developed into a collaborative effort by multiple departments in the colleges of Engineering; Computer, Mathematics and Physical Sciences; and Chemical and Life Sciences at the University of Maryland. The laboratory provides service and training in the areas of structural and compositional characterization of materials using electron microscopy to students and faculty of the University of Maryland and universities in the Washington, DC Metropolitan area including DC, Northern Virginia, and Maryland. Today, the NISPLab is operated as a shared experimental facility by the Maryland NanoCenter and the Materials Research Science and Engineering Center (MRSEC).

Mission

The purpose of the NISPLab is to provide state of the art analytical and high resolution characterization techniques for research and education in the nano- and bio-sciences. The laboratory is integrated with the Maryland NanoCenter and the University of Maryland Materials Research Science and Engineering Center (MRSEC).

Jeol 2100 TEM

Imaging with an Electron Microscope

An electron microscope uses high energy electrons as a source for imaging. An electron microscope uses electromagnetic lenses to converge the electron beam on a sample and to magnify the image.

What is Spectroscopy?

Spectroscopy in an electron microscope is the study of atomic excitations in a material produced by the incident electron beam. The excitations are characteristic of the atoms present in the material and allow the identification and quantitative analysis of the composition of the material under characterization. There are three types of spectroscopic techniques: energy dispersive X-ray spectroscopy (EDS), wavelength dispersive X-ray spectroscopy (WDS) and electron energy loss spectroscopy (EELS).