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 University of Maryland 
  

 Materials Research Science & Engineering Centers 

 National Science Foundation 

NISPLab Facilities and Equipment

Field Emission TEM | JEOL 2100FField Emission Transmission Electron Microscope (FE-TEM)
JEOL 2100F

301-405-8231
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The installation of our new 2100F field-emission transmission electron microscope is now completed. The microscope is now available to users. This electron microscope uses a high-brightness and high-coherence electron beam for high-spatial resolution analysis of material samples. Additionally, the chemical composition of samples can be determined using energy dispersive x-ray spectroscopy (EDS) and electron energy loss spectrometers (EELS) that we hope to install in the near future.

Specs
Accelerating voltage: 160, 200 kV
Electron gun: ZrO/W(100) field emission
Resolution: 0.19 nm (point-to-point)
0.10 nm (lattice)
0.2 nm (STEM lattice)
Spot size: 2-5 nm (TEM mode)
0.5-2.4 nm (Analytical mode)
Specimen tilt: +/- 25°
Imaging recording: CCD and/or Film

Electron Microprobe | JEOL JXA-8900 SuperprobeElectron Microprobe
JEOL JXA-8900 Superprobe

301-405-7948
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The Microprobe uses a focused electron beam to acquire information about the structure and chemical composition of materials. Attached wavelength dispersive x-ray (WDS) and EDS spectrometers can reveal the existence of almost any element down to small concentrations.

LaB TEM | JEOL 2100LaB6 TEM
JEOL 2100

The LaB6 TEM will be used for studies of biological and soft materials and for in-situ studies of nano-devices. It will also serve as the primary training TEM and for use in lab classes.

The JEM-2100 electron microscope provides solutions for a wide range of problems in the fields of materials, nanomaterials, and biological sciences. The JEM-2100 has three independent condenser lenses and produces the highest probe current for any given probe size. It also allows the user the selection of variaous illumination conditions, ranging from full convergent beam to parallel illumination. These functions enable improved analytical and diffraction capabilities in addition to high resolution imagin. The incorporation of the objective mini lens in the TEM with special modification provides the abiliy of caryy out Lorentz microscopy experiements. An EDS system will be attached on this TEM in the future to enhance analytical capabilities.

Specs
Accelerating voltage: 80, 100, 120, 160, 200 kV
Electron gun: LaB6 thremionic
Resolution: 0.23 nm (point-to-point)
0.14 nm (lattice)
Spot size: 20-200 nm (TEM mode)
1.0-25 nm (Analytical mode)
Specimen tilt: +/- 30°
Imaging recording: CCD and/or Film

Specimen PreparationSpecimen Preparation Facility

301-405-7725
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The specimen preparation facility includes various vacuum coaters and polishers for thinning samples and preparing them for electron microscopy observation.

Keck MicroscopeLow Temperature Scanning Microwave Microscope

Keck Foundation Advanced Low Temperature Multiscale Scanning Microwave Microscope

Documents & Manuals


Lab Safety Manual (PDF, under development.)

Standard Operating Procedures:

Electron Microprobe