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NanoCenter facilities take a major leap forward : NispLab
New FabLab facilities
Transmission Electron Microscopy (TEM)
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Jeol JEM-2100F TEM
A new JEOL field-emission transission electron microscope JEM-2100f TEM (FE-TEM) has been installed and is operating. The JEM-2100F TEM is an advanced ultra-high resolution TEM that is capable of imaging atomic level structure characterization of materials investigated in physical, materials, life and medical sciences and material engineering. This TEM will be fully equipped with a STEM (scanning transmission electron miscroscopy) system along with Gatan Imaging Filter (GIF), energy-dispersive X-ray spectrometer (EDS) and high resolution CCD camera.
Specs
| Accelerating voltage: |
160, 200 kV |
| Electron gun: |
ZrO/W(100) field emission |
| Resolution: |
0.19 nm (point-to-point)
0.10 nm (lattice)
0.2 nm (STEM lattice)
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| Spot size: |
2-5 nm (TEM mode)
0.5-2.4 nm (Analytical mode)
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| Specimen tilt: |
+/- 25° |
| Imaging recording: |
CCD and/or Film |
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JEM-2100F LaB6 TEM
In addition to the JEM-2100F TEM, a new JEOL JEM 2100 TEM has also recently been installed. The JEM-2100 electron microscope provides solutions for a wide range of problems in the fields of materials, nanomaterials, and biological sciences. The JEM-2100 has three independent condenser lenses and produces the highest probe current for any given probe size. It also allows the user the selection of variaous illumination conditions, ranging from full convergent beam to parallel illumination. These functions enable improved analytical and diffraction capabilities in addition to high resolution imagin. The incorporation of the objective mini lens in the TEM with special modification provides the abiliy of caryy out Lorentz microscopy experiements. An EDS system will be attached on this TEM in the future to enhance analytical capabilities.
Specs
| Accelerating voltage: |
80, 100, 120, 160, 200 kV |
| Electron gun: |
LaB6 thremionic |
| Resolution: |
0.23 nm (point-to-point)
0.14 nm (lattice)
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| Spot size: |
20-200 nm (TEM mode)
1.0-25 nm (Analytical mode)
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| Specimen tilt: |
+/- 30° |
| Imaging recording: |
CCD and/or Film |
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Other TEM microscopy enhancements
A number of special sample holders for in-situ experiments will be available in the near future. These holders, as shown in below, will allow for dynamic observation at nanoscale regime.
- High temperature heating holder for high temperature microstructure and phase study,
- Liquid nitrogen temperature holder for cryo-TEM microscopy,
- High angle tilting holder for tomography research, and
- Tilting and rotation holder for geometric orientation characterization.
New sample preparation facilities (e.g. plasma cleaner, electro-jet-polisher, etc.) are planned in addition to those specimen preparation equipments currently available in the center.
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Scanning Electron Microscopy (SEM)
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A new field-emission SEM, the Hitachi SU-70 Schottky field emission SEM, with analytical (EDS) capability provides many special features such as dual secondary electron detector system, high probe current, beam deceleration, field free mode for EBSD and magnetic samples and low kV backscattering electron imaging. These special features will enable users to investigate and characterize nanomaterials (both nanostructure imaging as well as microchemical analysis) in great detail.
Specs
| Accelerating voltage: |
0.5 ~ 30 kV |
| Landing voltage: |
0.1 ~ 2.0 kV |
| Electron gun: |
ZrO/W Schttokey field emission |
| Resolution: |
1.0 nm (15kV, WD = 4.0 mm)
1.6 nm ( 1kV, WD = 1.5 mm, deceleration mode)
2.5 nm ( 1kV, WD = 1.5 mm)
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| Detectors: |
Ultra-high resolution SE detector
High resolution SE detector
Backscattering electron detector
EDS detector (for microanalysis)
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