NanoCenter Spotlight

NISP Lab Introduces Hitachi SU-70 SEM

Hitachi's SU-70 SEM

The Hitachi SU-70 SEM is an analytical ultra-high resolution field emission gun SEM. The SEM, capable of capturing ultra-high resolution images with high beam current, is the first of its kind to be housed in an American academic institution. The SU-70 SEM is also equipped with Bruker's XFlash Silicon Drift Detector (SDD), the newest EDS detector on the current market.

The Hitachi SU-70 SEM comes to the Maryland NanoCenter and joins the recently acquired Hitachi S-3400N ESEM, located in the FabLab. The NISP Lab has trained more than 25 students in basic knowledge and operation of the SU-70 SEM.