Cryo SEM/FIB Workshop
Thursday, November 2, 2017
8:30 a.m.
1207 ERF Bldg.
For More Information:
Wen-An Chiou
301 405 0541
wachiou@umd.edu

This free workshop will be held at University of Maryland on November 2, 2017. This workshop will combine half-day lecture series with hands-on studies on an array of materials on the TESCAN XEIA PFIB-SEM. Lecturers include Dr. Ru-Ching Hsia, Director of the Electron Microscopy Core Imaging Facility at the University of Maryland College of Dentistry and Dr. Keana Scott, physical scientist in the Materials Measurement Science Division of the National Institute of Standards and Technology (NIST). Dr. Hsia holds a Ph.D. in Microbiology and Immunology from Stanford University and regularly provides instruction on cryogenic sample preparation. Dr. Scott holds a Ph.D. in Mechanical Engineering from University of Pittsburgh and a M.S. in biotechnology from Johns Hopkins University. Keana is a regular instructor at the Lehigh Microscopy School, including instruction on cryo FIB.

Lecture:
Room 1207 (IREAP, ERF Building); Breakfast: 8:30 am

Laboratory Demonstration:
Room 1237E (Jeong H. Kim Building)

Tescan will be providing support and training during the workshop from our key staff members. The University of Maryland also has convenient access to a suite of supporting cryo sample preparation equipment and cryogenic TEM on their JEOL 2100 TEM and STEM. Registration is required. Maximum participants are limited to 12. We encourage you to sign up ASAP.

Please email us to register: cleary@tescan-usa.com or wachiou@umd.edu.