June 21, 2018 UMD Home NanoCenter AIMLab
Back to Equipment List Probe Station I- with 4155C
Description The Micromanipulator probe station can accommodate up to 6" diameter samples. It has eight adjustable needle probes for testing devices and circuits on wafers. The Agilent 4155C Semiconductor Parameter Analyzer is menu-driven. Test routines for evaluation of transistors and electronic test structures are written and stored in the 4155C. Users are able to write and save their own programs.

Various multimeters are also available for device testing as well as an HP 576 Curve Tracer.
Location FabLab | Teaching Lab
Manufacturer Alessi/Agilent 4155C
Staff Contact JohnJohn Abrahams
Discussion Link Metrology Discussion Page
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Reservations No upcoming reservations at this time.
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Mon, Jun 04, 2018
11:30 am - 12:30 pm
David Shahin
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Sun, May 20, 2018
3:30 pm - 4:30 pm
Shahriar Aghaeimeibodi
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Sat, May 05, 2018
11:30 am - 12:00 pm
Shahriar Aghaeimeibodi
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Fri, May 04, 2018
10:45 am - 11:00 am
Yizhou Lu
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Wed, May 02, 2018
David Shahin
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Repeated device testing throughout the day - contact dshahin@umd.edu if probe station is needed
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