November 21, 2017 UMD Home NanoCenter AIMLab
Back to Equipment List Probe Station I- with 4155C
Description The Micromanipulator probe station can accommodate up to 6" diameter samples. It has eight adjustable needle probes for testing devices and circuits on wafers. The Agilent 4155C Semiconductor Parameter Analyzer is menu-driven. Test routines for evaluation of transistors and electronic test structures are written and stored in the 4155C. Users are able to write and save their own programs.

Various multimeters are also available for device testing as well as an HP 576 Curve Tracer.
Location FabLab | Teaching Lab
Manufacturer Alessi/Agilent 4155C
Staff Contact JohnJohn Abrahams
jabrah@umd.edu
301-405-6664
Discussion Link Metrology Discussion Page
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Tue, Nov 21, 2017
9:00 am - 12:00 pm
Mark Lecates
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Tue, Nov 21, 2017
8:15 am - 8:30 am
David Shahin
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Mon, Nov 20, 2017
5:45 pm - 6:00 pm
Yizhou Lu
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Mon, Nov 20, 2017
12:30 pm - 3:00 pm
Mark Lecates
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Mon, Nov 20, 2017
11:00 am - 11:15 am
David Shahin
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