February 22, 2018 UMD Home NanoCenter AIMLab
Back to Equipment List Probe Station I- with 4155C
Description The Micromanipulator probe station can accommodate up to 6" diameter samples. It has eight adjustable needle probes for testing devices and circuits on wafers. The Agilent 4155C Semiconductor Parameter Analyzer is menu-driven. Test routines for evaluation of transistors and electronic test structures are written and stored in the 4155C. Users are able to write and save their own programs.

Various multimeters are also available for device testing as well as an HP 576 Curve Tracer.
Location FabLab | Teaching Lab
Manufacturer Alessi/Agilent 4155C
Staff Contact JohnJohn Abrahams
Discussion Link Metrology Discussion Page
Login Help
Reservations No upcoming reservations at this time.
Please login to make a reservation.
Thu, Feb 22, 2018
1:15 pm - 1:30 pm
Yizhou Lu
View Reservation
Fri, Feb 09, 2018
10:30 am - 12:30 pm
Matthew Yung
View Reservation
Thu, Feb 08, 2018
3:30 pm - 6:00 pm
David Shahin
View Reservation
Mon, Feb 05, 2018
11:00 am - 11:45 am
Matthew Yung
View Reservation
Fri, Feb 02, 2018
11:45 am - 5:00 pm
David Shahin
View Reservation
Records to show:

You must have reservation permissions to view the manuals. Please login to view manuals.

index.php (38 B)

NanoCenter Group NanoCenter

Communicate Director: Jim O'Connor
Contact the Webmaster

Links Logos
Privacy Policy

Copyright The University of Maryland University of Maryland
2004-2018 Privacy Policy