September 26, 2017 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
Discussion Link Metrology Discussion Page
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Date Start End User
09/29/2017 10:30 AM 12:00 PM serge Alain Feuze Lekem

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Fri, Sep 29, 2017
10:30 am - 12:00 pm
serge Alain Feuze Lekem
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Tue, Sep 26, 2017
12:00 pm - 1:15 pm
Jiahao Zhan
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Tue, Sep 26, 2017
9:00 am - 9:45 am
Yevgeniy Ostrovskiy
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Mon, Sep 25, 2017
9:45 pm - 10:15 pm
Yonggang Yao
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Mon, Sep 25, 2017
4:00 pm - 5:00 pm
Lei Zhang
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