November 21, 2017 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
Discussion Link Metrology Discussion Page
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