June 21, 2018 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Discussion Link Metrology Discussion Page
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Date Start End User
06/22/2018 11:00 AM 01:30 PM Silas Simotwo

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Fri, Jun 22, 2018
11:00 am - 1:30 pm
Silas Simotwo
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Thu, Jun 21, 2018
11:15 am - 12:30 pm
Evans Gritton
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Thu, Jun 21, 2018
9:00 am - 11:00 am
Azadeh Farzaneh
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Wed, Jun 20, 2018
4:30 pm - 6:30 pm
Tanner Hamann
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Wed, Jun 20, 2018
2:30 pm - 3:00 pm
Mariama Rebello de Sousa Dias
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