November 28, 2021 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Reservations No upcoming reservations at this time.
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Logs
Tue, Nov 23, 2021
11:15 am - 11:30 am
Evans Gritton
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Tue, Nov 23, 2021
9:00 am - 11:00 am
TAHMID SAMI RAHMAN
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Tue, Nov 23, 2021
7:15 am - 9:00 am
Bibek Ramdam
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Fri, Nov 19, 2021
10:00 am - 11:30 am
Annaliese Drechsler
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Wed, Nov 17, 2021
1:30 pm - 2:15 pm
Evans Gritton
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