July 19, 2025 UMD Home NanoCenter AIM Lab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS silicon drift detector for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Rates
Large Commercial
$133/hr
Small Commercial / MTECH
$63/hr
External Non-profit / University
$42/hr
UMD
$27/hr
No Charge
$0/hr
Reservations
Date Start End User
07/21/2025 12:30 PM 02:00 PM Sheng-Wei Wang

Please login to make a reservation.
External Materials

If you plan to bring external materials into the lab, please notify the FabLab staff to ensure proper safety protocols and any equipment arrangements can be made ahead of your reservation. Please submit an External Materials Request form for each material you will bring.

Logs
Mon, Jul 21, 2025
12:30 pm - 2:00 pm
Sheng-Wei Wang
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Fri, Jul 18, 2025
2:15 pm - 3:30 pm
Aoife Zuercher
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Fri, Jul 18, 2025
1:00 pm - 2:30 pm
Jay Easter
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Deleted by: Jay Easter

Fri, Jul 18, 2025
12:15 pm - 1:00 pm
ZIYANG SHEN
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Fri, Jul 18, 2025
11:00 am - 12:00 pm
Christopher Tang
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SOPs
Manuals

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Recipes

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