November 21, 2017 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Discussion Link Metrology Discussion Page
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Tue, Nov 21, 2017
11:30 am - 12:15 pm
Hyun-Tae Kim
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Tue, Nov 21, 2017
11:00 am - 11:30 am
Dennis McOwen
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Deleted by: Dennis McOwen

Tue, Nov 21, 2017
9:00 am - 9:30 am
Lei Zhang
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Mon, Nov 20, 2017
3:30 pm - 4:00 pm
Shengjie Xie
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Mon, Nov 20, 2017
10:45 am - 12:00 pm
Yevgeniy Ostrovskiy
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