August 23, 2019 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
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Fri, Aug 23, 2019
3:15 pm - 4:30 pm
Tanner Hamann
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Fri, Aug 23, 2019
11:15 am - 11:30 am
Evans Gritton
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Fri, Aug 23, 2019
10:30 am - 11:00 am
Daniel Campbell
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EDS, CuxTiSe2
Fri, Aug 23, 2019
9:30 am - 10:30 am
Fan Yu
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Thu, Aug 22, 2019
9:30 pm - 10:00 pm
Fan Yu
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