January 18, 2020 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
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Fri, Jan 17, 2020
3:15 pm - 3:30 pm
Raymond Mencia
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Fri, Jan 17, 2020
2:00 pm - 3:00 pm
Tanner Hamann
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Thu, Jan 16, 2020
6:30 pm - 6:45 pm
Sandesh Kalantre
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Thu, Jan 16, 2020
2:00 pm - 2:45 pm
Evans Gritton
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Thu, Jan 16, 2020
12:00 pm - 12:30 pm
Tanner Hamann
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