| Description |
The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM |
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| Location | FabLab |
Exploratory Lab
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| Manufacturer |
Hitachi S-3400N Link |
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| Staff Contact |
 Jonathan Hummeljhummel1@umd.edu 301 405-5017 |
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| Discussion Link | Metrology Discussion Page Login Help |
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| Reservations |
Please login to make a reservation. |
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| Logs |
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| Manuals
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| Recipes |
