February 22, 2018 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Discussion Link Metrology Discussion Page
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Thu, Feb 22, 2018
10:00 am - 11:00 am
Zhezhen Fu
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Wed, Feb 21, 2018
10:30 am - 1:00 pm
Kyle Sendgikoski
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Tue, Feb 20, 2018
4:30 pm - 5:30 pm
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Tue, Feb 20, 2018
2:15 pm - 4:00 pm
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Mon, Feb 19, 2018
1:15 pm - 4:15 pm
Evans Gritton
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