September 26, 2017 UMD Home NanoCenter AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Discussion Link Metrology Discussion Page
Login Help
Reservations
Date Start End User
09/29/2017 10:30 AM 12:00 PM serge Alain Feuze Lekem

Please login to make a reservation.
Logs
Fri, Sep 29, 2017
10:30 am - 12:00 pm
serge Alain Feuze Lekem
View Reservation
Tue, Sep 26, 2017
12:00 pm - 1:15 pm
Jiahao Zhan
View Reservation
Tue, Sep 26, 2017
9:00 am - 9:45 am
Yevgeniy Ostrovskiy
View Reservation
Mon, Sep 25, 2017
9:45 pm - 10:15 pm
Yonggang Yao
View Reservation
Mon, Sep 25, 2017
4:00 pm - 5:00 pm
Lei Zhang
View Reservation
Records to show:
SOPs
Manuals

You must have reservation permissions to view the manuals. Please login to view manuals.

Recipes

NanoCenter Group NanoCenter
FabLab
AIMLab

Communicate Director: Jim O'Connor
Contact the Webmaster

Links Logos
Privacy Policy
Sitemap

Copyright The University of Maryland University of Maryland
2004-2017 Privacy Policy
Sitemap