November 21, 2017 UMD Home NanoCenter AIMLab
Back to Equipment List N&K Spectrophotometer
Description The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer.The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:

- Thickness, d - index of refraction, n
- Extinction Coefficient, k
- Energy Bandgap, Eg
- Interface Roughness, ?
Location FabLab | Main Fab Hall
Manufacturer N & K
Staff Contact JohnJohn Abrahams
jabrah@umd.edu
301-405-6664
Discussion Link Metrology Discussion Page
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Logs
Thu, Jul 27, 2017
11:30 am - 1:00 pm
Nina Uchida
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Measure SiO2
Tue, Jul 25, 2017
2:30 pm - 4:30 pm
Nina Uchida
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Measure SiO2
Mon, Jul 24, 2017
2:00 pm - 4:00 pm
Nina Uchida
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Measuring SiO2
Thu, Jun 22, 2017
2:00 pm - 2:30 pm
John Abrahams
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Wed, Jun 21, 2017
10:00 am - 10:30 am
John Abrahams
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Records to show:
SOPs
index.php (38 B)
met-03_sop_NK_Spectrophotometer_Rev_9_08 .pdf (126.93 KB)
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Recipes

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