The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer.The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:
- Thickness, d
- index of refraction, n
- Extinction Coefficient, k
- Energy Bandgap, Eg
- Interface Roughness, ?
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N & K
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