June 21, 2018 UMD Home NanoCenter AIMLab
Back to Equipment List N&K Spectrophotometer
Description The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer.The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:

- Thickness, d - index of refraction, n
- Extinction Coefficient, k
- Energy Bandgap, Eg
- Interface Roughness, ?
Location FabLab | Main Fab Hall
Manufacturer N & K
Staff Contact JohnJohn Abrahams
jabrah@umd.edu
301-405-6664
Discussion Link Metrology Discussion Page
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Logs
Wed, Jun 06, 2018
2:30 pm - 4:00 pm
Nina Uchida
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Etch and measure SiO2/Si wafers
Mon, Apr 16, 2018
10:30 am - 12:30 pm
Lovlesh Kaushik
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Thickness measurement on Al subtrates
Mon, Feb 26, 2018
2:15 pm - 2:45 pm
John Abrahams
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Training Evan Yamaguchi
Thu, Jul 27, 2017
11:30 am - 1:00 pm
Nina Uchida
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Measure SiO2
Tue, Jul 25, 2017
2:30 pm - 4:30 pm
Nina Uchida
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Measure SiO2
Records to show:
SOPs
index.php (38 B)
met-03_sop_NK_Spectrophotometer_Rev_9_08 .pdf (126.93 KB)
Manuals

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Recipes

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