October 13, 2025 UMD Home NanoCenter AIM Lab
Back to Equipment List Ellipsometer
Description

The Auto ELIII Ellipsometer is used to measure the optical constants of bare surfaces as well as refractive indices, full-cycle thicknesses, and zero- through ninth-order thicknesses of thin single- or double-layer transparent films on opaque materials. The optical constants are automatically computed and displayed from the raw measurement data.

Location FabLab | Main Fab Hall
Manufacturer Rudolph Auto EL III
Staff Contact JohnJohn Abrahams
jabrah@umd.edu
301-405-5018
Rates
Reservations No upcoming reservations at this time.
Please login to make a reservation.
External Materials

If you plan to bring external materials into the lab, please notify the FabLab staff to ensure proper safety protocols and any equipment arrangements can be made ahead of your reservation. Please submit an External Materials Request form for each material you will bring.

Logs
Thu, Oct 02, 2025
5:45 pm - 6:00 pm
Ahmed Shadman Alam
View Reservation
Mon, Sep 29, 2025
4:30 pm - 4:45 pm
Ahmed Shadman Alam
View Reservation
Fri, Sep 26, 2025
11:15 am - 11:30 am
Ahmed Shadman Alam
View Reservation
Thu, Sep 25, 2025
5:45 pm - 6:00 pm
Ahmed Shadman Alam
View Reservation
Wed, Sep 24, 2025
2:00 pm - 2:30 pm
Ahmed Shadman Alam
View Reservation
Records to show:
SOPs
index.php (38 B)
met-04_sop_ellipsometer_Rudolph.pdf (886.1 KB)
Manuals

You must have reservation permissions to view the manuals. Please login to view manuals.

CE_M2K_ESM-300.pdf (12.65 MB)
Recipes

NanoCenter Group NanoCenter
FabLab
AIM Lab

Communicate Director: Dr. Nam Kim
Contact the Webmaster

Links Logos
Privacy Policy
Sitemap

Copyright The University of Maryland University of Maryland
2004-2025
Privacy Policy
Sitemap