|Description||Users must consult with John Abrahams (5-6664) before using this tool. Correct sample mounting is critical! The HMS-5000 Hall Effect Measurement System can be used to characterize various materials including all semiconductors such as Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N& P Type) can be measured as well as metal films and dielectrics. It is fully is automated so that without user intervention, it will ramp to each user defined temperature, stabilize, make the measurement (including moving the magnet automatically), and then plot a variety of temperature-dependent material properties such as concentration versus temperature, mobility versus temperature, resistivity versus temperature, conductivity versus temperature, and Hall coefficient versus temperature. The system provides the test results as tabular data as well as in graphic form. The Once the user defines the desired temperature steps within the range of 80K to 350K and fills the two LN2 reservoirs, this system automatically applies and switches the input current, measures the voltages, changes temperature, and moves the magnets all without user intervention. Once the test is finished, all of the temperature-dependent graphs and tabular data are ready for viewing. Two reference samples are used to maintain calibration The operating manual and instructions are loaded on the PC that runs the software.|
|Location||FabLab | Exploratory Lab|
Ecopia Corp HMS-5000
|Discussion Link||Metrology Discussion Page
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