Ellipsometer is in horizontal mode. Vertical mode is not operational at this time.
$88/hr - Industry
Contact: John Abrahams firstname.lastname@example.org (301) 405-6664 The J.A. Woollam M-2000D Spectroscopic Ellipsometer, 8" (190-1000nm) is a fully automated measurement tool that measures the optical properties of thin film semiconductor materials, specifically the complex refractive index or dielectric function. Additionally, the Woollam has mapping functionality and the incidence angle can be varied (typically, measurements are made from 60 to 85
|Location||FabLab | 2300 KIM (Bldg #225)|
J.A. Woollam M-2000D
|Discussion Link||Metrology Discussion Page
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