June 21, 2018 UMD Home NanoCenter AIMLab
Back to Equipment List Woollam Spectroscopic Ellipsometer
Description Ellipsometer is in horizontal mode. Vertical mode is not operational at this time.
Rates:

$88/hr - Industry
$42/hr - Gov't/Non-profit/Ext Univ
$35/hr - UMD

Contact: John Abrahams jabrah@umd.edu (301) 405-6664 The J.A. Woollam M-2000D Spectroscopic Ellipsometer, 8" (190-1000nm) is a fully automated measurement tool that measures the optical properties of thin film semiconductor materials, specifically the complex refractive index or dielectric function. Additionally, the Woollam has mapping functionality and the incidence angle can be varied (typically, measurements are made from 60 to 85

Location FabLab | 2300 KIM (Bldg #225)
Manufacturer J.A. Woollam M-2000D
Link
Staff Contact JohnJohn Abrahams
jabrah@umd.edu
301-405-6664
Discussion Link Metrology Discussion Page
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