February 22, 2018 UMD Home NanoCenter AIMLab
Back to Equipment List Woollam Spectroscopic Ellipsometer
Description Ellipsometer is in Vertical mode. Contact John Abrahams if horizontal is needed.
Rates:

$88/hr - Industry
$42/hr - Gov't/Non-profit/Ext Univ
$35/hr - UMD

Contact: John Abrahams jabrah@umd.edu (301) 405-6664 The J.A. Woollam M-2000D Spectroscopic Ellipsometer, 8" (190-1000nm) is a fully automated measurement tool that measures the optical properties of thin film semiconductor materials, specifically the complex refractive index or dielectric function. Additionally, the Woollam has mapping functionality and the incidence angle can be varied (typically, measurements are made from 60 to 85

Location FabLab | 2300 KIM (Bldg #225)
Manufacturer J.A. Woollam M-2000D
Link
Staff Contact JohnJohn Abrahams
jabrah@umd.edu
301-405-6664
Discussion Link Metrology Discussion Page
Login Help
Reservations
Date Start End User
02/23/2018 02:00 PM 04:30 PM Lei Zheng

Please login to make a reservation.
Logs
Fri, Feb 23, 2018
2:00 pm - 4:30 pm
Lei Zheng
View Reservation
Wed, Feb 21, 2018
10:00 am - 10:30 am
Hossein Salami
View Reservation
ITO films prepared by ALD sample #1 & 2
Tue, Feb 20, 2018
3:00 pm - 3:15 pm
Hossein Salami
View Reservation
AlF3 film analysis
Tue, Feb 20, 2018
2:30 pm - 3:00 pm
John Abrahams
View Reservation
Training Kedar
Tue, Feb 20, 2018
11:00 am - 11:30 am
Jongbum Kim
View Reservation
Records to show:
SOPs
Manuals

You must have reservation permissions to view the manuals. Please login to view manuals.

Recipes

NanoCenter Group NanoCenter
FabLab
AIMLab

Communicate Director: Jim O'Connor
Contact the Webmaster

Links Logos
Privacy Policy
Sitemap

Copyright The University of Maryland University of Maryland
2004-2018 Privacy Policy
Sitemap