November 28, 2021 UMD Home NanoCenter AIMLab
Back to Equipment List Woollam Spectroscopic Ellipsometer
Description

Ellipsometer is in horizontal mode. Check with John Abrahams for Vertical mode.


Software was upgraded 2-15-2019. If there are problems, please let me know as soon as possible.


$37/hour for UMD

$50/hour for Gov't- non-profit

$91/hr - small commercial

$160/hour for Large commercial.


Contact: John Abrahams at jabrah@umd.edu or (301) 405-6664


The J.A. Woollam M-2000D Spectroscopic Ellipsometer, 8" (190-1000nm) is a fully automated measurement tool that measures the optical properties of thin film semiconductor materials, specifically the complex refractive index or dielectric function. Additionally, the Woollam has mapping functionality and the incidence angle can be varied (typically, measurements are made from 60 to 85

Location FabLab | 2300 KIM (Bldg #225)
Manufacturer J.A. Woollam M-2000D
Link
Staff Contact JohnJohn Abrahams
jabrah@umd.edu
301-405-6664
Reservations No upcoming reservations at this time.
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Logs
Mon, Nov 08, 2021
12:45 pm - 1:00 pm
Yi-Siou Huang
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Mon, Nov 08, 2021
11:00 am - 12:00 pm
Victoria Castagna Ferrari
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Mapping
Thu, Nov 04, 2021
1:00 pm - 2:00 pm
Yi-Siou Huang
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Training- Yi-Siou Huang
Tue, Oct 26, 2021
1:30 pm - 1:45 pm
Alexander Kozen
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measure thickness of ALD films
Tue, Oct 26, 2021
11:00 am - 12:00 pm
BINH HOANG
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FeF3 600C
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