September 25, 2020 UMD Home NanoCenter AIMLab
Back to Equipment List Profilometer P-20 Long Scan profiler
Description The P-20 is used to measure thin film thicknesses less than100Å and 165 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 200mm scan length
Location FabLab | Teaching Lab
Manufacturer Tencor 500
Staff Contact MarkMark Lecates
mlecates@umd.edu
301-405-5197
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Logs
Fri, Oct 02, 2015
9:00 am - 11:30 am
John Abrahams
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Fri, Sep 18, 2015
9:00 am - 11:30 am
John Abrahams
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Fri, Jun 19, 2015
3:15 pm - 4:15 pm
David Somers
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Fri, May 15, 2015
3:00 pm - 3:30 pm
Garth Egan
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Thu, Feb 26, 2015
12:30 pm - 3:30 pm
John Abrahams
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SOPs
index.php (38 B)
sop_tencor_p-20.docx (649.55 KB)
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