September 25, 2020 UMD Home NanoCenter AIMLab
Back to Equipment List Profilometer P-1 Long Scan Profiler
Description The P-1 is used to measure thin film thicknesses less than 100Å and up to 300 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 100mm scan length
Location FabLab | Main Fab Hall
Manufacturer Tencor
Staff Contact MarkMark Lecates
mlecates@umd.edu
301-405-5197
Reservations No upcoming reservations at this time.
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Logs
Fri, Jul 24, 2020
10:00 am - 12:00 pm
Beihan Zhao
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mark
Wed, Jul 01, 2020
10:00 am - 11:00 am
Beihan Zhao
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mark
Mon, Jun 29, 2020
9:30 am - 10:30 am
Beihan Zhao
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Fri, Jan 17, 2020
11:15 am - 12:15 pm
Beihan Zhao
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Thu, Jan 16, 2020
11:15 am - 12:15 pm
Beihan Zhao
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This is reserved for new profilometry experiments. Also need to use some of the silver paste near the SEM room.
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