May 21, 2022 UMD Home NanoCenter AIMLab
Back to Equipment List Profilometer P-1 Long Scan Profiler
Description The P-1 is used to measure thin film thicknesses less than 100Å and up to 300 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 100mm scan length
Location FabLab | Main Fab Hall
Manufacturer Tencor
Staff Contact MarkMark Lecates
Reservations No upcoming reservations at this time.
Please login to make a reservation.
Wed, May 11, 2022
11:30 am - 12:30 pm
Beihan Zhao
View Reservation
Tue, May 10, 2022
1:00 pm - 2:00 pm
Beihan Zhao
View Reservation

Deleted by: Mark Lecates

Wed, May 04, 2022
3:30 pm - 4:30 pm
Beihan Zhao
View Reservation
Wed, Apr 13, 2022
10:00 am - 11:30 am
Beihan Zhao
View Reservation
Thu, Mar 03, 2022
4:30 pm - 5:30 pm
Beihan Zhao
View Reservation
Records to show:

You must have reservation permissions to view the manuals. Please login to view manuals.


NanoCenter Group NanoCenter

Communicate Director: John Abrahams
Contact the Webmaster

Links Logos
Privacy Policy

Copyright The University of Maryland University of Maryland
2004-2022 Privacy Policy