November 28, 2021 UMD Home NanoCenter AIMLab
Back to Equipment List Profilometer P-1 Long Scan Profiler
Description The P-1 is used to measure thin film thicknesses less than 100Å and up to 300 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 100mm scan length
Location FabLab | Main Fab Hall
Manufacturer Tencor
Staff Contact MarkMark Lecates
Reservations No upcoming reservations at this time.
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Tue, Oct 26, 2021
2:00 pm - 2:30 pm
Beihan Zhao
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This is to measure polymer layer/copper pad thickness
Fri, Aug 20, 2021
1:15 pm - 2:00 pm
Beihan Zhao
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This is a schedule to measure the thickness of some deposition, as well as using some silver paste in the fablab
Mon, Jul 12, 2021
3:00 pm - 4:00 pm
Beihan Zhao
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This is a scan to assist another student in the group
Tue, Apr 27, 2021
3:15 pm - 3:30 pm
Rebecca Moriarty
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Thu, Apr 15, 2021
1:00 pm - 2:00 pm
Beihan Zhao
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