November 28, 2021 UMD Home NanoCenter AIMLab
Back to Equipment List Profilometer P-1 Long Scan Profiler
Description The P-1 is used to measure thin film thicknesses less than 100Å and up to 300 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 100mm scan length
Location FabLab | Main Fab Hall
Manufacturer Tencor
Staff Contact MarkMark Lecates
mlecates@umd.edu
301-405-5197
Reservations No upcoming reservations at this time.
Please login to make a reservation.
Logs
Tue, Oct 26, 2021
2:00 pm - 2:30 pm
Beihan Zhao
View Reservation
This is to measure polymer layer/copper pad thickness
Fri, Aug 20, 2021
1:15 pm - 2:00 pm
Beihan Zhao
View Reservation
This is a schedule to measure the thickness of some deposition, as well as using some silver paste in the fablab
Mon, Jul 12, 2021
3:00 pm - 4:00 pm
Beihan Zhao
View Reservation
This is a scan to assist another student in the group
Tue, Apr 27, 2021
3:15 pm - 3:30 pm
Rebecca Moriarty
View Reservation
Thu, Apr 15, 2021
1:00 pm - 2:00 pm
Beihan Zhao
View Reservation
Records to show:
SOPs
Manuals

You must have reservation permissions to view the manuals. Please login to view manuals.

Recipes

NanoCenter Group NanoCenter
FabLab
AIMLab

Communicate Director: John Abrahams
Contact the Webmaster

Links Logos
Privacy Policy
Sitemap

Copyright The University of Maryland University of Maryland
2004-2021 Privacy Policy
Sitemap