March 21, 2018 UMD Home FabLab AIMLab
Event Information

Tuesday, March 8, 2016
11:00 a.m.-12:30 p.m.
A.V. Williams Building, Room 2460
For More Information:
Martha Heil
301 405 0876

Abstract: The introduction of any new material into manufacturing requires a comprehensive understanding of how structure influences properties and how processing controls the structure. Carbon nanotubes (CNTs), with their exceptional mechanical, thermal, and electrical properties, have the potential to make high-performance, multi-functional nanocomposites.  However, a combination of limited raw material availability, batch-to-batch variability, and an incomplete understanding of process-structure-property relationships has delayed the widespread adoption of CNT nanocomposites.  To help overcome these obstacles to adoption, we have used characterization techniques such as TEM tomography, Li- and Ga-ion microscopy, and neutron scattering to generate a detailed, multi-scale picture of CNT dispersion in random and aligned composites.  We then use the microstructural information to develop models of the material properties, including their dielectric behavior.  These models have enabled us to develop a high-throughput, microwave metrology method that is sensitive to the material dielectric properties and can be employed for quality control of both the raw CNTs and the finished composite in a manufacturing environment.  In this talk, I will describe our characterization approach, model development, and microwave measurement technique.

This Event is For: Campus • Clark School • Graduate • Faculty • Post-Docs • Alumni


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May 1, 2018 4:30 p.m.
Whiting-Turner Lecture: Kathy Warden, Northrop Grumman More»

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