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NanoDay 2016 & EM Workshops

May 17 - Electron Microscopy Workshops - Recent Advancements in Electron and Ion Microscopy

Electron Microscopy Workshops, with in-depth presentations by experienced microscopists.

Click here for more information about the EM Workshops

May 18 - NanoDay - Quantum Physics, Energy Storage, and Nanomanufacturing

Feature plenary talks by prominent scientists in nanoscience, a poster session for breaking research (with awards), and networking opportunities.

Click here for more information about the speakers

News & Announcements

Updated Poster Information

Mon. May 16, 2016

We have updated the poster delivery and poster layout sections of the posters page.

AIM Lab Open House

Wed. May 11, 2016

The AIM Lab will have an Open House during both the EM Workshop and NanoDay.

EM Workshop Update

Wed. May 11, 2016

We have updated information on the talks for the EM Workshop.

EM Workshop Update

Fri. April 22, 2016

We have updated information on the talks for the EM Workshop.

Poster session topics

Fri. April 1, 2016

Submitting a poster? NanoDay's poster session will feature seven categories. Posters will be judged for originality, quality and newsworthiness. Register for NanoDay here and submit your abstract here.

Register now!

Fri. April 1, 2016

Registration is now open for NanoDay 2016. There is no fee to register.

Save the date!

Fri. April 1, 2016

NanoDay 2016 is official! Please save the dates, May 17 for EM Workshops, and May 18 for Maryland NanoCenter NanoDay.

EM Workshops - May 17

Ed Principe


Three Dimensional Structural and Chemical Imaging: A discussion of panoscopic methods

Tom Isabel


Managing (High) Tension: Atomic Resolution (S)TEM from 30 kV to 300 kV

Tom Schamp


The Dedicated STEM: Deceptively Simple Usage with Cutting Edge Results

Edgar Voelkl


Surface and Transmission Imaging at High Resolution for True Characterization of Nano-technology Materials at 30kV and Below

Tara Nylese


Fundamentals of Quantitative Analysis with EDS, Combined with X-Ray Map Imaging

Robert Brandom


Extreme EDS Count Rates from Beam-Sensitive and Nano-Scale Features

Soeren Eyhusen


ZEISS ORION NanoFab: Applications and New Developments

Jamil Clarke


Orthogonal 3D Analysis FIB-SEM and Its Latest Applications

Robert Brandom


Advances in EBSD: Transmission Kikuchi Diffraction, Dynamical Simulation, and 3D Data Analysis

Matt Nowell


New Applications of Fast EBSD Detectors

Anahita Pakzad


Application of High Speed Cameras for 4D Data Collection in STEM

Jim Kilcrease


A Revolutionary Era of 120kV Transmission Electron Microscopy: All Digital Design, High-mag. Tomography and Ionic Liquid

Shinsuke Kawanishi


ASEM - Tabletop Atmospheric Scanning Electron Microscope

Kristin Olexa


Innovative Tool for Post FIB Sample Preparation: Fischiones M1080 PicoMill

Billy Podrazky


Contactless Sample Preparation Methods & Applications using the Hitachi IM4000 Broad Ion Beam Milling System

Speakers - May 18

Steve Rolston, University of Maryland, Joint Quantum Institute

Steve Rolston

University of Maryland, Joint Quantum Institute

The Second Quantum Revolution?

Mohommed Hafezi, University of Maryland

Mohammad Hafezi

University of Maryland

Photonic nanostructures: topologically robust transport

Esther Takeuchi, Stony Brook University

Esther Takeuchi

Stony Brook University

Advancing Energy Storage through Materials: The need for multiscale investigation from the molecular to the mesoscale

Marina Leite, University of Maryland

Marina Leite

University of Maryland

Imaging the mesoscale behavior of materials for energy harvesting and storage

Alexander Liddle




Bruker Edax Tescan Hitachi FEI Company JEOL Angstrom Scientific

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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