Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and FIB (Focused Ion Beam) short courses that will be offered this winter (January 14 to 17, 2018 for SEM, January 22 to 25 for TEM and January 28 to 31 for FIB) at the AIM Lab, NanoCenter.
These short courses provide an introduction to SEM, TEM and FIB, both theory and hands-on practice, for anyone with little or no prior experience. Attendees will gain basic knowledge of how to operate a SEM and/or TEM and/or FIB after taking the short course. This course is also recommended as a refresher course to individuals with prior knowledge and operating familiarity with the SEM and/or TEM and/or FIB.
The deadline for registration is January 10, 17 and 23, 2018 for SEM, TEM and FIB short courses, respectively.
To register, contact Dr. Wen-An Chiou, Director of the AIM Lab, Maryland NanoCenter.
January 3, 2019