Scanning Electron Microscopy (SEM), Focus Ion Beam (FIB) and Transmission Electron Microscopy (TEM) short courses that will be held in this winter break (January 14 through 25, 2013) at the NISP Lab, NanoCenter.
These short courses provide an introduction to SEM, FIB, and TEM, both theory and hands-on practice, for anyone with little or no prior experience. Attendees will gain basic knowledge of how to operate a SEM, FIB, and/or TEM after taking the short course. This course is also recommended as a refresher course to individuals with prior knowledge and operating familiarity with the SEM, FIB, and/or TEM. Please see attached files for details.
Deadline for registration is January 10, 2013.
Please let Dr. Wen-An Chiou (email@example.com) know should you have any questions.
FIB Announcement (.doc)
SEM Announcement (.doc)
TEM Announcement (.doc)
January 4, 2013