December 1, 2021 UMD Home FabLab AIMLab
JEM 2100 FEG TEM/STEM Back to Equipment List
Operational Status ‚óŹ Online
Description

The JEM 2100 FE-TEM, a field-emission gun transmission electron microscope, is a state-of-the-art and fully equipped ultra-high resolution analytical TEM that is capable of providing high spatial resolution atomic imaging and microstructure analysis of material samples.

This microscope uses a high-brightness and high-coherence electron beam to carry out ultra-high resolution microchemical analysis using its attached energy dispersive x-ray spectrometer (EDS) and electron energy loss spectrometer (EELS). The 2100 FEG-TEM is also equipped with a scanning image observation device, thus becoming a so-called scanning transmission electron microscope (STEM). This enables researchers to observe and investigate samples in a scanning mode that further expands its applications; for instance, to acquire a material's chemical composition from a small point or a line profile, or to reveal elemental distribution maps.

This FEG-TEM is also equipped with a Gatan imaging filter that comes with sophisticated software covering all aspects of energy-filtered imaging and energy-loss spectroscopy (EELS). Energy-filtering is a powerful technique that can dramatically improve image contrast and resolution in the TEM as well as quickly obtain highly sensitive elemental maps of materials. By contrast, energy-filtering transmission electron microscopy (EFTEM) is capable of producing electron images from only a narrow range of energies.

Biprism

The JEOL 2100F Field-Emission TEM has a biprism installed which allows users to perform electron holography, an interferometry technique that produces images of both the amplitude and (quantum-mechanical) phase of the electron wave produced by the specimen. This allows users to obtain a wealth of information that is normally difficult to obtain by other means, such as the electric and magnetic fields inside the specimen, as well as the mean inner potential, including any shifts in the valence potential due to chemical doping (as in semiconductor electronics).

Location AIM Lab | 1237D Kim Eng. Bldg.
Manufacturer JEOL JEM-2100 FEG
Staff Contact Sz-ChianSz-Chian Liou
scliou@umd.edu
301-405-0551
Rates
UMD
$61/hr
External Non-profit / University
$94/hr
Small Commercial / MTECH
$189/hr
Large Commercial
$248/hr
No Charge
$0/hr
Reservations
Date Start End User
12/02/2021 09:30 AM 12:30 PM Wen-An Chiou
12/02/2021 02:00 PM 05:00 PM Thilini Dissanayake
12/03/2021 09:00 AM 12:00 PM John Cumings
12/03/2021 12:00 PM 01:30 PM Chiyu Zhang
12/03/2021 02:00 PM 05:00 PM Wen-An Chiou
Logs
Tue, Dec 21, 2021
2:00 pm - 5:00 pm
Jiayue Sun
View Reservation
Fri, Dec 17, 2021
2:00 pm - 5:00 pm
Jiayue Sun
View Reservation
Wed, Dec 15, 2021
2:00 pm - 5:00 pm
Jiayue Sun
View Reservation
Fri, Dec 10, 2021
2:00 pm - 5:00 pm
Sz-Chian Liou
View Reservation
ENMA 683 Class
Thu, Dec 09, 2021
2:00 pm - 5:00 pm
Thilini Dissanayake
View Reservation
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Manuals

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Recipes

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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