September 21, 2018 UMD Home FabLab AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
External Non-profit / University
Small Commercial / MTECH
Large Commercial
Reservations No upcoming reservations at this time.
Fri, Sep 21, 2018
9:30 am - 10:30 am
Patrick Ott
View Reservation
Wed, Sep 19, 2018
7:00 pm - 7:15 pm
Michael Yeh
View Reservation

Deleted by: Michael Yeh

Wed, Sep 19, 2018
10:30 am - 11:30 am
Patrick Ott
View Reservation
Wed, Sep 19, 2018
9:00 am - 11:00 am
Patrick Ott
View Reservation

Deleted by: Jonathan Hummel

Mon, Sep 17, 2018
6:30 pm - 7:00 pm
Jung Yeon Han
View Reservation
Records to show:

You must have lab permissions to view the manuals.

Please login to view manuals or contact the lab staff to obtain permissions.


Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

Communicate Contact Us
Contact the Webmaster
Follow us on TwitterTwitter logo

Links Privacy Policy

Copyright The University of Maryland University of Maryland