September 28, 2020 UMD Home FabLab AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
External Non-profit / University
Small Commercial / MTECH
Large Commercial
No Charge
Reservations No upcoming reservations at this time.
Mon, Sep 28, 2020
10:00 am - 11:00 am
Sean O'Leary
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Fri, Sep 25, 2020
9:00 am - 11:00 am
Jaesung Lee
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Mon, Sep 21, 2020
1:00 pm - 2:00 pm
Haotian Wang
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Fri, Sep 18, 2020
10:00 am - 12:00 pm
Arielle Miller
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Deleted by: Jonathan Hummel

Thu, Sep 17, 2020
1:00 pm - 2:00 pm
Arielle Miller
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