August 19, 2022 UMD Home FabLab AIMLab
Hitachi S-3400 Variable Pressure SEM Back to Equipment List
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The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
External Non-profit / University
Small Commercial / MTECH
Large Commercial
No Charge
Reservations No upcoming reservations at this time.
Thu, Aug 18, 2022
1:15 pm - 2:00 pm
Evans Gritton
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Thu, Aug 18, 2022
9:15 am - 10:30 am
Sean O'Leary
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Thu, Aug 18, 2022
8:15 am - 9:15 am
Mitchell Gross
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Wed, Aug 17, 2022
11:00 am - 12:00 pm
Daniel Ivanov
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Tue, Aug 16, 2022
12:45 pm - 1:45 pm
Haotian Wang
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Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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