March 21, 2018 UMD Home FabLab AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
External Non-profit / University
Small Commercial / MTECH
Large Commercial
Reservations No upcoming reservations at this time.
Please login to make a reservation.
Tue, Mar 20, 2018
8:45 pm - 9:45 pm
Ivan Penskiy
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Mon, Mar 19, 2018
12:00 pm - 1:00 pm
Lei Zhang
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Fri, Mar 16, 2018
4:45 pm - 5:45 pm
Sangwook Chu
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Fri, Mar 16, 2018
2:00 pm - 3:15 pm
Hyun-Tae Kim
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Thu, Mar 15, 2018
8:45 pm - 9:15 pm
Raymond Mencia
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Colleges A. James Clark School of Engineering
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