December 12, 2018 UMD Home FabLab AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Rates
UMD
$24/hr
External Non-profit / University
$37/hr
Small Commercial / MTECH
$57/hr
Large Commercial
$110/hr
Reservations
Date Start End User
12/12/2018 03:00 PM 04:00 PM Sandesh Kalantre
Logs
Wed, Dec 12, 2018
3:00 pm - 4:00 pm
Sandesh Kalantre
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Tue, Dec 11, 2018
11:00 am - 11:30 am
Jonathan Hummel
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Deleted by: Jonathan Hummel

Mon, Dec 10, 2018
11:00 am - 11:30 am
Jonathan Hummel
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Sun, Dec 09, 2018
5:30 pm - 7:00 pm
Lei Zhang
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Sun, Dec 09, 2018
11:00 am - 12:30 pm
Lei Zhang
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SOPs
Manuals

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Recipes

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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