June 24, 2018 UMD Home FabLab AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM
Description

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Link
Staff Contact JonathanJonathan Hummel
jhummel1@umd.edu
301 405-5017
Rates
UMD
$25/hr
External Non-profit / University
$38/hr
Small Commercial / MTECH
$84/hr
Large Commercial
$124/hr
Reservations No upcoming reservations at this time.
Logs
Fri, Jun 22, 2018
11:00 am - 2:00 pm
Silas Simotwo
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Fri, Jun 22, 2018
9:30 am - 10:30 am
Hyun-Tae Kim
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Thu, Jun 21, 2018
10:15 pm - 10:30 pm
Lei Zhang
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Thu, Jun 21, 2018
11:15 am - 12:30 pm
Evans Gritton
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Thu, Jun 21, 2018
9:00 am - 11:00 am
Azadeh Farzaneh
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Recipes

Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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