January 16, 2018 UMD Home FabLab AIMLab
Back to Equipment List Hitachi S-3400 Variable Pressure SEM

The Hitachi Scanning Electron Microscope is a variable pressure SEM that can image non conductive samples at higher chamber pressures. The non-conductive samples can be imaged in either back scatter or our new ESED secondary detector. In normal operation (high vacuum mode), it has an ultimate resolution of approximately 3 nm. The Hitachi is fitted with an EDS analyzer for determining elemental composition of samples. Please, no powder samples in this SEM

Location FabLab | Exploratory Lab
Manufacturer Hitachi S-3400N
Staff Contact JonathanJonathan Hummel
301 405-5017
External Non-profit / University
Small Commercial / MTECH
Large Commercial
Reservations No upcoming reservations at this time.
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Fri, Jan 12, 2018
9:45 am - 10:15 am
Zhezhen Fu
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Thu, Jan 11, 2018
3:00 pm - 5:00 pm
Lei Zhang
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Deleted by: Lei Zhang

Thu, Jan 11, 2018
10:00 am - 10:30 am
Zhezhen Fu
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Thu, Jan 11, 2018
9:30 am - 10:00 am
Zhezhen Fu
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Wed, Jan 10, 2018
4:15 pm - 5:00 pm
Jung Yeon Han
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