|Operational Status||● Online|
The N&K Analyzer is a type of thin film measurement system composed of proprietary software for thin film analysis, a spectrophotometer to measure reflectance, an x-y stage and a personal computer.The following parameters can be determined for semiconductors, dielectrics, transparent conductors, photoresists, polymers, color filters and very thin metal films:
- Thickness, d
- index of refraction, n
- Extinction Coefficient, k
- Energy Bandgap, Eg
- Interface Roughness, ?
|Location||FabLab | Main Fab Hall|
N & K
External Non-profit / University
Small Commercial / MTECH
|Reservations||No upcoming reservations at this time.|
You must have lab permissions to view the manuals.
Please login to view manuals or contact the lab staff to obtain permissions.