July 9, 2020 UMD Home FabLab AIMLab
Back to Equipment List AFM -DI Nanoscope III multimode (Chemistry)
Description Digital Instruments (Veeco)Multimode AFM with nanoscope III controller10 micron scanner Nanoscope Version 5.3 software Capabilities Contact mode Tapping Mode Lateral Force Liquid cell Accesory AFM probes/supplies available in facility at cost price SiN contact probe (<15 nm tip radius) 4 cantilevers / Au-Cr coated Si Contact probe (< 10 nm tip radius) 1 cantilever / Au coated Si tapping probe (< 10 nm tip radius) 1 cantilever / Au coated 15 mm Specimen discs 12 mm glass sample mount 9.9 mm mica discs (interleafed) Gel-pak box for storing probes
Location SAC | Chemistry BO127
Staff Contact Karen Gaskell
External Non-profit / University
Small Commercial / MTECH
Large Commercial
Reservations No upcoming reservations at this time.
Mon, Aug 13, 2018
1:00 pm - 5:00 pm
Karen Gaskell
View Reservation

Deleted by: Karen Gaskell

Training Ruiyu Mi (PI: Liangbing Hu)
Fri, Mar 09, 2018
8:00 am - 8:15 am
Karen Gaskell
View Reservation

Deleted by: Karen Gaskell

Thu, Mar 08, 2018
5:30 pm - 7:30 pm
Peng Wang
View Reservation

Deleted by: Peng Wang

Sun, Mar 04, 2018
11:15 am - 12:15 pm
Xiaoying Lin
View Reservation
Wed, Feb 28, 2018
3:30 pm - 4:45 pm
Yunfeng Li
View Reservation
Records to show:

You must have lab permissions to view the manuals.

Please login to view manuals or contact the lab staff to obtain permissions.


Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

Communicate Contact Us
Contact the Webmaster
Follow us on TwitterTwitter logo

Links Privacy Policy

Copyright The University of Maryland University of Maryland