Ellipsometer is in horizontal mode. Check with John Abrahams for vertical mode.
$88/hr - Industry
Contact: John Abrahams email@example.com (301) 405-6664 The J.A. Woollam M-2000D Spectroscopic Ellipsometer, 8" (190-1000nm) is a fully automated measurement tool that measures the optical properties of thin film semiconductor materials, specifically the complex refractive index or dielectric function. Additionally, the Woollam has mapping functionality and the incidence angle can be varied (typically, measurements are made from 60 to 85
|Location||FabLab | 2300 KIM (Bldg #225)|
J.A. Woollam M-2000D
External Non-profit / University
Small Commercial / MTECH
You must have lab permissions to view the manuals.
Please login to view manuals or contact the lab staff to obtain permissions.