August 19, 2022 UMD Home FabLab AIMLab
Profilometer P-1 Long Scan Profiler Back to Equipment List
Operational Status ● In maintenance
Description The P-1 is used to measure thin film thicknesses less than 100Å and up to 300 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 100mm scan length
Location FabLab | Main Fab Hall
Manufacturer Tencor
Staff Contact MarkMark Lecates
External Non-profit / University
Small Commercial / MTECH
Large Commercial
No Charge
Reservations No upcoming reservations at this time.
Wed, May 11, 2022
11:30 am - 12:30 pm
Beihan Zhao
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Tue, May 10, 2022
1:00 pm - 2:00 pm
Beihan Zhao
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Deleted by: Mark Lecates

Wed, May 04, 2022
3:30 pm - 4:30 pm
Beihan Zhao
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Wed, Apr 13, 2022
10:00 am - 11:30 am
Beihan Zhao
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Thu, Mar 03, 2022
4:30 pm - 5:30 pm
Beihan Zhao
View Reservation
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Colleges A. James Clark School of Engineering
The College of Computer, Mathematical, and Natural Sciences

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