|Operational Status||● In maintenance|
|Description||The P-1 is used to measure thin film thicknesses less than 100Å and up to 300 microns. It measures the deflection of a stylus as it is drawn over the sample. Capable of 100mm scan length|
|Location||FabLab | Main Fab Hall|
External Non-profit / University
Small Commercial / MTECH
|Reservations||No upcoming reservations at this time.|
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